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author | Clément Foucault <foucault.clem@gmail.com> | 2022-07-22 22:03:06 +0300 |
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committer | Clément Foucault <foucault.clem@gmail.com> | 2022-07-22 22:03:06 +0300 |
commit | 7d8b651268df74157f89858eda9ddce9fd452138 (patch) | |
tree | 54321b498337bdd32248aea2f6a708019d6838cd /source/blender/blenkernel/intern/armature_deform.c | |
parent | 676a2f690c3e3fffe2e515208d4d308e0a96e8e6 (diff) |
EEVEE-Next: Add exposure awareness to denoising
This uses the exposure to get a better approximation of the perceptual
brighness of a sample before accumulating it.
Note that we do not modify exposure of the image. Only the samples weights
are computed differently.
Diffstat (limited to 'source/blender/blenkernel/intern/armature_deform.c')
0 files changed, 0 insertions, 0 deletions