1 files changed, 67 insertions, 0 deletions
diff --git a/extern/sdlew/include/SDL2/SDL_test_harness.h b/extern/sdlew/include/SDL2/SDL_test_harness.h
new file mode 100644
index 00000000000..4ec6dc45a81
--- /dev/null
+++ b/extern/sdlew/include/SDL2/SDL_test_harness.h
@@ -0,0 +1,67 @@
+
+#ifndef _SDL_test_harness_h
+#define _SDL_test_harness_h
+
+#include "begin_code.h"
+
+#ifdef __cplusplus
+extern "C" {
+#endif
+
+//! Definitions for test case structures
+#define TEST_ENABLED  1
+#define TEST_DISABLED 0
+
+//! Definition of all the possible test return values of the test case method
+#define TEST_ABORTED        -1
+#define TEST_STARTED         0
+#define TEST_COMPLETED       1
+#define TEST_SKIPPED         2
+
+//! Definition of all the possible test results for the harness
+#define TEST_RESULT_PASSED              0
+#define TEST_RESULT_FAILED              1
+#define TEST_RESULT_NO_ASSERT           2
+#define TEST_RESULT_SKIPPED             3
+#define TEST_RESULT_SETUP_FAILURE       4
+
+//!< Function pointer to a test case setup function (run before every test)
+typedef void (*SDLTest_TestCaseSetUpFp)(void *arg);
+
+//!< Function pointer to a test case function
+typedef int (*SDLTest_TestCaseFp)(void *arg);
+
+//!< Function pointer to a test case teardown function (run after every test)
+typedef void  (*SDLTest_TestCaseTearDownFp)(void *arg);
+
+typedef struct SDLTest_TestCaseReference {
+
+    SDLTest_TestCaseFp testCase;
+
+    char *name;
+
+    char *description;
+
+    int enabled;
+} SDLTest_TestCaseReference;
+
+typedef struct SDLTest_TestSuiteReference {
+
+    char *name;
+
+    SDLTest_TestCaseSetUpFp testSetUp;
+
+    const SDLTest_TestCaseReference **testCases;
+
+    SDLTest_TestCaseTearDownFp testTearDown;
+} SDLTest_TestSuiteReference;
+
+int SDLTest_RunSuites(SDLTest_TestSuiteReference *testSuites[], const char *userRunSeed, Uint64 userExecKey, const char *filter, int testIterations);
+
+#ifdef __cplusplus
+}
+#endif
+#include "close_code.h"
+
+#endif
+